doc. no : qw0905- rev. : date : data sheet super bright round type led lamps LUR3330 ligitek electronics co.,ltd. property of ligitek only LUR3330 18 - oct - 2005 a
directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. package dimensions ligitek electronics co.,ltd. property of ligitek only part no. LUR3330 page 1/4 8.6 5.0 5.9 1.5max ?? 0.5 typ 1.0min 25.0min 2.54typ 7.6 30 x 60 x 0 x 100% 50% 75% 25% 0 25% -30 x -60 x 50% 75% 100%
note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. absolute maximum ratings at ta=25 j i fp pd i f tstg t opr tsol symbol typical electrical & optical characteristics (ta=25 j ) power dissipation reverse current @5v storage temperature soldering temperature operating temperature parameter peak forward current duty 1/10@10khz forward current part no. LUR3330 120 -40 ~ +100 max 260 j for 5 sec max (2mm from body) -40 ~ +85 ir 10 ratings ur 120 40 mw j j g a ma ma unit ligitek electronics co.,ltd. property of ligitek only page 2/4 36 viewing angle 2 c 1/2 (deg) min. 220 20 min. 1.5 forward voltage @ ma(v) max. 2.4 peak wave length f pnm 660 spectral halfwidth ??f nm 20 typ. luminous intensity @20ma(mcd) 350 emitted red part no LUR3330 material gaalas lens color red diffused
ligitek electronics co.,ltd. property of ligitek only 0.0 0.8 forward voltage@20ma normalize @25 j relative intensity@20ma normalize @25 j wavelength (nm) ambient temperature( j ) fig.5 relative intensity vs. wavelength relative intensity@20ma 1.0 0.0 600 0.5 -40 -20 650 700 750 -40 80 20 04060100 ambient temperature( j ) -20 0 40 20 100 80 60 1 forward current(ma) relative intensity normalize @20ma fig.3 forward voltage vs. temperature 0.9 1.0 1.1 1.2 0 1 1.0 1.0 0.5 1.5 2.0 2.5 3.0 1 fig.4 relative intensity vs. temperature forward voltage(v) 3.0 2.0 4.0 0.0 5.0 0.5 forward current(ma) 100 10 1000 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 10 100 1000 ur chip fig.2 relative intensity vs. forward current 2.5 1.5 1.0 2.0 3.0 page3/4 part no. LUR3330
ligitek electronics co.,ltd. property of ligitek only 0.0 0.8 forward voltage@20ma normalize @25 j relative intensity@20ma normalize @25 j wavelength (nm) ambient temperature( j ) fig.5 relative intensity vs. wavelength relative intensity@20ma 1.0 0.0 600 0.5 -40 -20 650 700 750 -40 80 20 04060100 ambient temperature( j ) -20 0 40 20 100 80 60 1 forward current(ma) relative intensity normalize @20ma fig.3 forward voltage vs. temperature 0.9 1.0 1.1 1.2 0 1 1.0 1.0 0.5 1.5 2.0 2.5 3.0 1 fig.4 relative intensity vs. temperature forward voltage(v) 3.0 2.0 4.0 0.0 5.0 0.5 forward current(ma) 100 10 1000 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 10 100 1000 ur chip fig.2 relative intensity vs. forward current 2.5 1.5 1.0 2.0 3.0 page 3/4 part no. LUR3330
this test intended to see soldering well performed or not. the purpose of this test is the resistance of the device under tropical for hous. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec high temperature high humidity test thermal shock test solder resistance test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only 4/4 page part no. LUR3330
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